Parameters and specifications
IM3570
- low-capacity measurement with improved stability
- DC measurement frequency range; 4 Hz - 5 MHz
- contact control function
- more on the IM3570 product page
Detailed Product Overview
The HIOKI IM3570-9000 combines the precision of an LCR meter with the advanced analysis functions of an impedance analyzer. It features built-in equivalent circuit analysis and covers a frequency range from 4 Hz to 5 MHz, enabling detailed evaluation of components and materials with frequency-dependent impedance. With measurement speeds as fast as 0.5 ms at 100 kHz, a basic impedance accuracy of ±0.08%, phase accuracy of ±0.05°, and guaranteed accuracy from 1 mΩ to 200 MΩ, the IM3570-9000 provides precise and reliable measurements across a wide impedance range.
Versatile and Easy to Use
The instrument supports multiple modes including LCR, which is capable of simultaneously measuring DC resistance, sweep, and continuous measurement. Functions such as comparator and BIN judgments, along with frequency and level sweeps, make it suitable for both automated test systems and laboratory evaluation. The 5.7″ color TFT touchscreen simplifies operation and allows intuitive adjustment of measurement conditions. Interfaces including USB, LAN, RS-232C, GP-IB, and handler I/O provide flexible connectivity for system integration.
Equivalent Circuit Analysis included
The IM3570-9000 features built-in equivalent circuit analysis for in-depth evaluation of complex impedance characteristics. The firmware provides five representative circuit models and can automatically select the most suitable one based on the measurement data. In addition to basic three-element R-L-C models, it also supports a four-element model optimized for piezoelectric device analysis. The instrument can display Nyquist (Cole-Cole) and admittance plots directly, offering valuable insight into frequency-dependent behavior and material properties.
Flexible Fixture Ecosystem
A wide range of fixtures enable stable and repeatable connections to different device types. Options include Kelvin clip leads for standard components, direct-connection test fixture for stable measurement of leaded components, and SMD test probes for small surface-mount devices. This fixture ecosystem ensures that the IM3570-9000 can be adapted to the requirements of both development labs and automated production environments.
Designed and manufactured in Japan, the IM3570-9000 combines reliable measurement performance with long-term stability, making it a versatile instrument for both R&D and production lines.
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