IM7587 Impedance Analyzer

• measurement by RF I-V method (not by four-wire method using automatically balanced bridge, which is only suitable for measurement at lower frequencies)
• contact Check function to rule out incorrect contacting of the DUT
• comparison function
• storage of up to 30 sets of measurement condition settings for compensation in LCR mode and 16 sets in Analyzer mode
• SMD component measurement capability using Test Fixture IM9201
• interfaces: USB for PC connection, USB for flash drive, LAN, EXT I/O, optional GPIB and RS-232C
• includes 1 m connection cable

Detailed Product Overview

Impedance measurements up to 3 GHz enable analysis of RF components, for example in wireless communication applications. With a frequency range from 1 MHz to 3 GHz, the IM7587 supports characterization of components such as chip inductors, ferrite beads, filters, resonators and matching networks in RF circuit design. 

Measurement Performance and Analysis Functions

With a basic accuracy of ±0.65% of impedance and ±0.38° of phase, the IM7587 is designed for precise impedance measurements up to 3 GHz. Typical repeatability of approximately ±0.07% supports reproducible measurement results under defined conditions across its entire frequency range. A typical measurement time of 0.5 ms enables fast frequency sweeps without compromising measurement stability. Test signal levels from −40.0 dBm to +1.0 dBm enable controlled excitation of devices under test. 

The analyzer supports LCR, sweep and continuous measurement modes and provides evaluation functions such as comparator and BIN judgment, as well as area, peak and spot analysis. All measurement settings and analysis functions are accessed directly via the integrated 8.4 inch color touchscreen. Standard interfaces include USB, LAN and EXT I/O, with optional RS-232C and GP-IB. 

For more advanced analysis, the IM7587 features an Equivalent Circuit Analysis function with five representative circuit models and automatic model selection based on measurement data. In addition to three-element R-L-C models, it also supports a four-element model designed for piezoelectric device analysis, enabling applications ranging from general component characterization to resonator evaluation. 

Test Head and Fixtures

The IM7587 employs a compact, palm-sized test head connected to the main unit by a specified connection cable. It is available with 1 m or 2 m cable lengths, allowing users to balance measurement accuracy and installation flexibility. Placing the test head close to the device under test minimizes signal path length and reduces parasitic inductance and capacitance that would otherwise affect high-frequency measurements. This design supports stable and reproducible results up to 3 GHz while reducing bench space requirements in RF laboratories. 

For measurements of SMD components, the IM7587 is typically used in combination with the IM9201 SMD test fixture. The IM9201 is designed for six standard SMD package sizes from 0201 to 1210 and provides stable two-terminal bottom contacts at the component interface. The contact geometry is designed for measurements across the entire specified measurement frequency range. Components are positioned on defined contact pads using a stopper and pusher mechanism, ensuring correct alignment and repeatable placement. This reduces measurement variation and enables precise characterization of SMD RF components such as chip inductors, ferrite beads and filters. 

For stable mounting, the IM9201 test fixture is installed on the IM9200 test fixture stand. The stand provides a secure base and a defined mechanical alignment between the test head and the fixture and includes a magnifier to facilitate handling of small components. The IM9906 adapter is required to connect the 7 mm interface of the test fixture to the analyzer test head’s 3.5 mm connector. 

Calibration and Measurement Integrity

The optional IM9905 calibration kit provides OPEN, SHORT and LOAD reference standards for correction of system-related measurement errors in high-frequency impedance measurements up to 3 GHz. The calibration compensates parasitic effects in the measurement path up to the defined reference plane, including the analyzer test head and connecting interfaces. The calibration standards are connected via the same IM9906 adapter used for test fixtures. 

Comprehensive contact check functions, including DCR testing, Hi-Z reject and waveform verification, are used to verify contact quality before and, if required, after measurement. This helps prevent invalid results caused by insufficient probe contact or unstable component placement. Developed and manufactured in Japan, the IM7587 is designed for stable measurement performance over time in measurement and test environments with high demands on long-term stability.