Materials Lab XM Materials Test System

    • system for materials testing
    • belongs to the family of compact Apps-XM (Application specific eXtreme Measurement) devices based on the technologies of the advanced Modulab XM platform
    • precision DC measurements (I-V, pulses) and electrochemical impedance spectroscopy EIS (C-V, impedance, Mott-Schottky analysis) with instant switching between techniques without changing wiring
    • warranty: 2 years
    Solartron Analytical
    Other parameters
    Price on request
    Cat. no: MaterialsLabXM.w
    availability on request

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    Parameters and specifications

    voltage range ±8 V
    current range ±300 mA
    voltage measurement resolution 1 μV
    current resolution 1.5 pA
    sampling frequency 1 MS/s
    maximum sample generation frequency 64 MS/s
    generator voltage resolution 400 μV (≥ 3 V)
    150 μV (< 3 V)
    FRA sampling frequency 40 MS/s
    frequency analysis range 10 μHz to 1 MHz
    • two or four wire measurement modes
    • DC techniques in rapid succession (I-V, P-E, pulses) with sampling rates up to 1 MS/s
    • AC frequency response analysis (FRA) techniques include multisine FFT, harmonic and intermodulation analysis
    • equipment suitable for characterization of OLEDs (Organic Light Emitting Diode), dielectrics or semiconductors
    • time-domain measurements and AC tests can be sequenced in succession with instantaneous switching allowing the use of DC and pulse waveforms for charge carrier activation and subsequent analysis by EIS
    • four auxiliary channels for integration of synchronous measurement by optical, mechanical or other transducers
    • high frequency resolution for resonance characterisation
    • PC-based XM-studio software with ready-made templates and convenient control from the start of the test through data analysis to report generation
      - test control including EIS, admittance, permittivity or capacitance measurements
      - a range of data analysis options such as curve fitting, Fill Factor evaluation, parameter estimation (R, C, L, Warburg ...)
      - temperature tests fully integrated in XM-studio software with support for connecting cryostats, peaks and sample holders
    • availability of accessories (amplifier, Sample Holder, Cryostat ...), compatibility with contacting stations for semiconductor testing

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