ModuLab XM MTS Materials Test System

    • material testing system
    • configurable platform for testing high resistances and impedances such as dielectrics and insulating materials, or conversely for testing highly conductive materials
    • offers both time-domain (DC) and frequency-domain (AC) analysis
    • test selection, measurement control and results display are managed by the intuitive PC-based XM-studio software
    • The XM MTS (Xtreme Measurement Materials Test System) version of the ModuLab is designed for materials research, but can also be extended for electrochemical or photoelectrochemical experiments
    • Warranty: 2 years
    Solartron Analytical
    Other parameters
    Price on request
    Cat. no: ModuLabXMMTS.w
    availability on request

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    Parameters and specifications

    max. size of measured impedance >100 TΩ (MAT + MHV100 + MFA + MREF)
    min. magnitude of measured impedance 10 μΩ (MAT +MBST 2 A + MREF)
    max. voltage range

    ±8 V (MAT)
    ±100 V (MHV100)
    max. voltage output resolution

    400 μV (≥ 3 V, MAT)
    150 μV (< 3 V, MAT)
    max. current range

    ±100 mA (MAT)
    ± 2 A (MBST 2 A)
    max. current resolution

    1.5 pA (MAT)
    0.15 fA (MFA)
    sampling frequency

    1 MS/s (MAT)
    40 MS/s (MFRA)
    maximum sample generation frequency 64 MS/s (MAT)
    fequency analysis range 10 μHz to 1MHz (MFRA)
    • two or four wire measurement modes
    • device in conjunction with PC software allows the generation of automatic sequences of DC and AC techniques:
      • I-V measurements for characterization of electronic and dielectric materials
      • P-E measurements (polarization/electrical field) for characterization of ferroelectric materials
      • high-speed pulse measurements for electronic and dielectric materials
      • step and smooth (analogue-like) ramp tests
      • evaluation of impedance, admittance, permittivity / capacitance of the electrical module
      • C-V measurements (capacitance vs. DC voltage), Mott-Schottky analysis
    • control modules:
      • XM MAT 1MHz - for time domain analysis
      • XM MFRA 1MHz - for AC measurements
    • slave modules for modification of signal parameters:
      • XM MHV100 - high voltage option (100 V)
      • XM MFA - low current option
      • XM MREF - module to increase the accuracy of AC analysis
      • XM MBST 2A - high current option (2 A)
    • multi-channel system can also be configured in combination with an electrochemical set-up, whereby simultaneous measurements on the channels can be controlled individually
    • modules are plug and play
    • the XM-studio software offers a range of data analysis options such as curve fitting obtained from equivalent schematics, FF (Fill Factor) evaluation
    • multisine FFT analysis speeds up the test performed over the entire frequency band
    • harmonic intermodulation analysis
    • availability of accessories (Sample Holder, Cryostat...)

    Downloads and links

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