Fast edges, high current: current probes for SiC and GaN
Why an oscilloscope current probe needs both higher bandwidth and a higher usable frequency to keep up with modern power semiconductors, and how the new HIOKI CT6704 and CT6705 deliver them.
Power semiconductors have moved on. SiC and GaN switch faster and at higher frequencies than the silicon they replace, and that puts two very different demands on the current probe you watch them with.
You need the bandwidth to actually see the switching edge instead of a rounded-off approximation of it. And you need the probe to still carry a useful current at the frequency where that switching happens, rather than forcing you onto a bigger probe just to survive it.
The CT6704 and CT6705 were built around exactly these two demands.





