NSG 5071 Inductive Switch Transient Test Circuit

The NSG 5071 is designed exactly according to EMC-CS-2009.1 for CI 220 A1, A2-1, A2-2, C1, C2 and RI 130 test pulses using an inductive/relay transient generator test circuit. In this test circuit, which uses the same type of relay, the NSG 5071 is also equipped with the CI 260 Waveform F. This test circuit is defined in Appendix F for pulses A, C, and RI 130 and in Figure 19-10 for CI 260 Waveform F.

The basic philosophy of this test circuit is to better reproduce the actual switching transients. The reproducibility of this test circuit is not based on output characteristics as in traditional automotive immunity testing, but on a fixed generator design using several predefined components. Many of these components are defined in the standard as critical with no possibility of substitution. These components are used according to the requirements of the standard.

The test circuit is based primarily on Potter and Brumfield relays and two inductors from Osborne Transformer. The relay is used in three ways: to switch off the voltages on the inductors, thereby causing large transients of inductive recoil, to self-excite, and in the case of the F waveform, to randomly test for failure.

The NSG 5071 is suitable for use of the required component in a variety of configurations according to the standard to provide a single output to the EUT and to make application as easy as possible.