RM3542C-3 Resistance Meter
- precision resistance meter (best basic accuracy up to ±0.005% rdg. ±0.001% f.s.*) designed for very high-speed in-line testing
- ideal for testing chip resistors and ferrite inductors
- resistance measurement range: 0.01 µΩ* to 120 MΩ
- measuring current: 100 nA to 100 mA DC
- different variants vary in measurement ranges, maximum resolution and accuracy, communication interfaces, etc.
- warranty: 3 years
*applies only to RM3542C-3 version
Parameters and specifications
| RM3542C-1 (standard) | RM3542C-2 (standard) | RM3542C-3 (advanced) | RM3542C-4 (economy) | RM3542C-5 (economy) | |
| number of measurement ranges / total resistance measurement range | 16 / 100 nΩ - 120 MΩ | 16 / 100 nΩ - 120 MΩ | 17 / 10 nΩ - 120 MΩ | 10 / 100 nΩ - 120 MΩ | 10 / 100 nΩ - 120 MΩ |
| best accuracy | ±0.006% rdg. ±0.001% f.s. (at 1000 Ω range) | ±0.005% rdg. ±0.001% f.s. (at 1000 Ω range; this high accuracy is guaranteed for 90 days) | ±0.006% rdg. ±0.001% f.s. (at 1000 Ω range) | ||
| open-circuit voltage | max. 20 V DC | ||||
| max. measurement speed | as fast as 0.9 ms/sample in FAST mode | ||||
| communication interfaces | RS-232C | RS-232C, GPIB | RS-232C | RS-232C | RS-232C, GPIB |
Additional features common to all models
Jumper resistor measurement function (Jumper Mode)
This function speeds up production testing of components with extremely low resistance, such as jumper resistors. Measuring components below 100 mΩ typically requires longer measurement time to ensure very high accuracy. Since this delay can slow down overall production throughput (cycle time), Jumper Mode skips slower high-accuracy measurement ranges at values of 100 mΩ or lower. This enables fast and reliable PASS/FAIL judgment for jumper resistors while maintaining high production capacity.
Example: testing a 100 mΩ jumper resistor (zero-ohm resistor) with comparator limits set to 100 mΩ (upper limit) and 50 mΩ (lower limit).
Instrument settings
Measurement speed: FAST, Delay 2 (time between trigger and measurement): 0 ms
Protection of sensitive DUTs (Voltage Limit Function)
Limits the applied voltage to 5 V or less (Applied Voltage Limit) for safe and accurate measurement of micro-components, such as size 0080004 resistors. Gradual application of the Contact Improvement function on both High and Low sides suppresses inrush current and prevents parameter changes in sensitive components such as ferrite inductors.
Instrument settings: set Contact Improvement to “Pulse” mode and enable either Low-Power measurement mode or the Applied Voltage Limiter.
Elimination of poor contact (Contact Improvement Function)
The pre-measurement contact improvement function (17/25/35/50 mA) ensures stable probe contact. Continuous contact monitoring (Contact Check and Voltage Monitor) reduces judgment errors caused by poor contact and minimizes the risk of line stoppages.
Improved sorting and evaluation efficiency (BIN Measurement Function)
The BIN Measurement function performs automatic evaluation and sorting into 0–6 categories (up to 7 classes/BINs). It reduces system load and waiting time, thereby increasing efficiency on production lines with strictly defined takt times.
Improved inspection reliability and overall efficiency of taping machines (ΔR Function)
The ΔR function (automatic inter-stage evaluation) automatically compares measurement results from two separate instruments and flags defects when the difference exceeds a preset threshold. This improves inspection reliability and reduces system load by eliminating manual checks.
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