VersaSCAN Scanning Electrochemical Systems

    • platform for spatially resolved measurements in electrochemistry and materials research
    • enables localization of electrochemical phenomena
    • high positioning resolution and repeatability thanks to piezoelectric motors
    • unified platform for 7 different techniques; the selected technique depends on the chosen model/configuration of the system
    • warranty: 2 years
    Ametek Scientific Instruments
    Other parameters
    Price on request
    Cat. no: VersaSCAN.w
    availability on request

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    Parameters and specifications

    • positioning range of the VersaSCAN Base (VS-BASE) system:X: 100 mm
      Y: 100 mm
      Z: 100 mm
    • the generated measurement map can represent current distribution, impedance, relative work function, or topography
    • the following systems are available:VS-SECM (Scanning ElectroChemical Microscope) – scanning electrochemical microscope (DC and AC), using bipotentiostatic measurements at the probe tip and sample
      • VS-STYLUS – constant-distance scanning electrochemical microscope based on the unique STYLUS probe design
      • VS-LEIS (Localized Electrochemical Impedance Spectroscopy) – localized electrochemical impedance spectroscopy for all applications benefiting from EIS measurements; combines wide bandwidth and high accuracy, e.g. for local SoC (State of Charge) measurements or surface defect analysis
      • VS-SVET (Scanning Vibrating Electrode Technique) – scanning vibrating electrode technique enabling voltage distribution mapping, for example to identify corrosion areas
        VS-SKP (Scanning Kelvin Probe) – scanning Kelvin probe, i.e. a microscope that maps the anodic/cathodic character of a sample through non-destructive measurement of relative work function, with the sample and probe separated by an air gap
      • VS-SDC (Scanning Droplet Cell) – scanning droplet cell with a droplet electrode enabling electrochemical measurements on a controlled droplet moving across the sample surface, eliminating the influence of reaction products on the measurement
      • VS-OSP (Non-contact Optical Surface Profiler) – non-contact optical surface mapping system based on laser technology, suitable for combination with other techniques
    • VersaSCAN integrates the capabilities of the measurement instruments used (VersaSTAT potentiostats)
    • accessories such as electrochemical test cells and an imaging system are available

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    Call us on +420 325 610 123 and ask for a specialist in this field.